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Conductive atomic force microscopy study of silica nanotrench structure
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10.1063/1.2436709
/content/aip/journal/apl/90/4/10.1063/1.2436709
http://aip.metastore.ingenta.com/content/aip/journal/apl/90/4/10.1063/1.2436709
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

(Color online) (a) Laser microscopy image of the anisotropic concavoconvex nanostructure formed on silicon substrates and (b) element analysis on its cross section by STEM.

Image of FIG. 2.
FIG. 2.

(Color online) Topographies (left) and corresponding current image (right) of silica nanotrench structure. The scan size is .

Image of FIG. 3.
FIG. 3.

plots on the different parts of the nanotrench nanostructure (a) and corresponding plot (b). In the plot, symbols 엯, ◻, ▵, ▿, and ◇ stand for measurement on the bottom of trench parts, while ● and ∎ stand for measurement on the ridge parts.

Image of FIG. 4.
FIG. 4.

(Color online) Enlarged topographies (left) and corresponding current image (right) on a concave. The scan size is .

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/content/aip/journal/apl/90/4/10.1063/1.2436709
2007-01-25
2014-04-24
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Conductive atomic force microscopy study of silica nanotrench structure
http://aip.metastore.ingenta.com/content/aip/journal/apl/90/4/10.1063/1.2436709
10.1063/1.2436709
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