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(Color online) (a) Laser microscopy image of the anisotropic concavoconvex nanostructure formed on silicon substrates and (b) element analysis on its cross section by STEM.
(Color online) Topographies (left) and corresponding current image (right) of silica nanotrench structure. The scan size is .
plots on the different parts of the nanotrench nanostructure (a) and corresponding plot (b). In the plot, symbols 엯, ◻, ▵, ▿, and ◇ stand for measurement on the bottom of trench parts, while ● and ∎ stand for measurement on the ridge parts.
(Color online) Enlarged topographies (left) and corresponding current image (right) on a concave. The scan size is .
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