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(Color online) (a) SEM image of a typical GaAs microdisk. (b) Sample scan of a doublet in a GaAs disk at . Fitting the data gives the linewidth and the splitting . Although not visible in (a), the edge roughness is different for the (c) GaAs and (d) AlGaAs samples. Scale bars are in (a) and in (c) and (d).
(Color online) Measured (a) and (b) for the (+,×) GaAs TE- and TM-polarized microdisk modes and (엯,◻) TE and TM modes, respectively. In (c) and (d), connected points represent calculated bounds on (c) and (d) for each family of modes. The data were compiled from two disks of each material.
Summary of material absorption rates.
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