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Efficient focusing of hard x rays to by a total reflection mirror
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10.1063/1.2436469
/content/aip/journal/apl/90/5/10.1063/1.2436469
http://aip.metastore.ingenta.com/content/aip/journal/apl/90/5/10.1063/1.2436469
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Schematic illustration of experimental setup for evaluating x-ray nanofocusing mirror. The intensity profile on the focal plane is measured by the wire scanning method.

Image of FIG. 2.
FIG. 2.

Elliptical profile (a) and figure error profile (b) of the fabricated focusing mirror. A figure accuracy of (rms) was achieved. This surface is produced by EEM.

Image of FIG. 3.
FIG. 3.

Relationship between wire position and beam intensity measured by an x-ray photon detector located behind the wire. Plot interval is from .

Image of FIG. 4.
FIG. 4.

Intensity distribution profile of focused beam. This profile was obtained by differentiating the curve shown in Fig. 3 using a interval.

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/content/aip/journal/apl/90/5/10.1063/1.2436469
2007-01-29
2014-04-19
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Efficient focusing of hard x rays to 25nm by a total reflection mirror
http://aip.metastore.ingenta.com/content/aip/journal/apl/90/5/10.1063/1.2436469
10.1063/1.2436469
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