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Temperature-dependent reflectivity spectra in the midinfrared region obtained during the heating process. The inset shows the temperature-dependent change of the integrated reflectivity, , which monotonically increases with temperature.
(a) Schematic diagram of the experimental setup. (b) Visual image of the film with gold electrodes. The dotted area corresponds to the mapping region. A aperture size used for these measurements is indicated as an open square. (c) The current curve with a voltage amplitude of . (d) The time-resolved MCT signal, , for the regions along the square trace shown in (b).
Mapping data of the MCT detector signal, , [(a)–(c)] and the temperature modeled [(d)–(f)] for , 30, and for the area enclosed by the dotted line in Fig. 2(b).
Line scan curves for the MCT detector signal, , and the temperature profiles calculated for the area along the trace in Fig. 2(b) at , 30, and by using the reflection mode with a aperture (a) and the transmission mode with a aperture (b). Electric powers applied in each case are 0.9 and .
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