1887
banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
Band offsets of stacks measured by ultraviolet and soft x-ray photoelectron spectroscopies
Rent:
Rent this article for
USD
10.1063/1.2437096
/content/aip/journal/apl/90/5/10.1063/1.2437096
http://aip.metastore.ingenta.com/content/aip/journal/apl/90/5/10.1063/1.2437096
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

(a) Valence band spectrum measured by UPS with (40, ): (1) GeON and (2) ; (b) zoom on the valence band edge of the first spectrum.

Image of FIG. 2.
FIG. 2.

Spectra measured for the GeON stack by SR-PES: (a) valence band spectrum at [zoom on the Ge onset ]; (b) N core level spectrum at ; (c) valence band spectrum at (zoom on the O and IS edges).

Image of FIG. 3.
FIG. 3.

Energy band diagram of the structure as deduced from UPS and SR-PES measurements.

Loading

Article metrics loading...

/content/aip/journal/apl/90/5/10.1063/1.2437096
2007-02-01
2014-04-18
Loading

Full text loading...

This is a required field
Please enter a valid email address
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Band offsets of HfO2∕GeON∕Ge stacks measured by ultraviolet and soft x-ray photoelectron spectroscopies
http://aip.metastore.ingenta.com/content/aip/journal/apl/90/5/10.1063/1.2437096
10.1063/1.2437096
SEARCH_EXPAND_ITEM