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Temperature dependence of on and off current-voltage characteristics of -thick structures in a semilogarithmic scale. A compliance value of was used.
vs curves of the on (solid symbols) and off (open symbols) currents of Fig. 1 at bias voltages of for various compliance currents (triangles: and squares: ). The minus sign of the axis means that the data were measured in reverse bias.
vs curves of the high-resistance currents before and after forming at . (slope of the solid line) represents the thermal activation energy. The inset represents a magnified plot in the high temperature region.
vs curves of and whose temperature dependences were obtained separately without switching at each temperature. . The inset shows the temperature dependence of the normalized resistivity, , for and a bulk Ni film.
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