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Growth and structure of thin films
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10.1063/1.2435944
/content/aip/journal/apl/90/6/10.1063/1.2435944
http://aip.metastore.ingenta.com/content/aip/journal/apl/90/6/10.1063/1.2435944
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Structural characterization of PVO films on LAO (001) substrates. X-ray diffraction (a) showing highly crystalline, epitaxial films of PVO. [(b) and (c)] Phi scans confirming in-plane epitaxial relationships to be and .

Image of FIG. 2.
FIG. 2.

(Color online) Electron microscopy of PVO films on LAO(001) substrates. (a) Cross-section HRTEM image of the PVO/LAO interface. The inset shows the SAED confirming the in-plane registry of film and substrate. Highly magnified HRTEM image and illustration also illustrate the highly distorted PVO structure. (b) STEM image of PVO down the [010] zone axis. (c) Experimental EELS spectra for PVO along with simulated EELS spectra for edge in PVO assuming possible and oxidation states.

Image of FIG. 3.
FIG. 3.

(Color online) Raman spectra for PVO film on LAO substrate.

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/content/aip/journal/apl/90/6/10.1063/1.2435944
2007-02-06
2014-04-25
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Growth and structure of PbVO3 thin films
http://aip.metastore.ingenta.com/content/aip/journal/apl/90/6/10.1063/1.2435944
10.1063/1.2435944
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