Full text loading...
(Color online) (a) X-ray diffraction pattern of thin film obtained by IBAD technique. (b) XPS high-resolution scan over Pd peak on thin film.
(Color online) [(a) and (b)] HAADF STEM image of and thin films, respectively. (c) EDS spectra from the bright particles and the dark matrix in thin film.
(Color online) Optical absorbance (in terms of arbitrary units) of (black), TiON (red), (blue), and (green) thin films.
(Color online) In situ XPS high-resolution scan over Pd peaks on thin film in the dark (green line) and after visible-light illumination (black line). Note; red dashed curve fits peaks, while blue dashed curve fits peaks after visible-light illumination.
Article metrics loading...