1887
banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
Nanoanalysis of crystalline properties of GaN thin film using tip-enhanced Raman spectroscopy
Rent:
Rent this article for
USD
10.1063/1.2458343
/content/aip/journal/apl/90/6/10.1063/1.2458343
http://aip.metastore.ingenta.com/content/aip/journal/apl/90/6/10.1063/1.2458343
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

(a) Schematic of the experimental setup for tip-enhanced Raman spectroscopy. (b) Enlarged view around focal area.

Image of FIG. 2.
FIG. 2.

Far-field micro-Raman spectrum of GaN, showing good crystalline quality.

Image of FIG. 3.
FIG. 3.

Raman spectra obtained with tip (a) off the sample and (b) on the sample. The true near-field component obtained by subtracting (a) from (b) is shown in (c).

Image of FIG. 4.
FIG. 4.

Near-field subtraction spectra at some of the randomly chosen tip positions.

Loading

Article metrics loading...

/content/aip/journal/apl/90/6/10.1063/1.2458343
2007-02-06
2014-04-25
Loading

Full text loading...

This is a required field
Please enter a valid email address
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Nanoanalysis of crystalline properties of GaN thin film using tip-enhanced Raman spectroscopy
http://aip.metastore.ingenta.com/content/aip/journal/apl/90/6/10.1063/1.2458343
10.1063/1.2458343
SEARCH_EXPAND_ITEM