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(Color online) (a) Scanning electron microscopy image of GaN nanorods. (b) Experimental setup and procedures for generating electricity by deforming a piezoelectric nanorod with a conductive atomic force microscopy (AFM) tip. The AFM scans across a nanorod in contact mode. (c) Topography image and (d) corresponding output current image of the nanorod arrays. (e) Line profiles from the topography and output current images across a nanorod.
Scanning electron microscopy image of GaN nanorods. (a) Before etching and (b) After etching. (c) Schematic definition of a nanorod and the coordination system. (d) Corresponding longitudinal piezoelectricity induced electric field distribution in the nanorod. [(e) and (g)] Contacts between the AFM tip and the semiconductor GaN nanorod at two reversed local contact potentials (positive and negative). (f) Reverse and forward biased Schottky rectifying behaviors.
(Color online) Variation of current output vs scanning speed of the bended GaN nanorod. The red line is plotted according to the characteristics of the current flow in a Schottky diode given by Eq. (1).
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