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X-ray diffraction patterns of PBZ thin films deposited under various OMRs.
Hysteresis loop of PBZ films measured at room temperature.
Electric field dependence of dielectric constant, loss tangent, tunability (filled symbols), and FOM (open symbols) of the PBZ films measured at .
Dielectric constant and losses of the PBZ thin films sputtered under 10% OMR as a function of the frequency and the applied voltage. The inset is a magnified plot of the resonance phenomenon under .
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