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Near-field second harmonic generation by using uncoated silicon tips
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10.1063/1.2709941
/content/aip/journal/apl/90/9/10.1063/1.2709941
http://aip.metastore.ingenta.com/content/aip/journal/apl/90/9/10.1063/1.2709941
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Figures

Image of FIG. 1.
FIG. 1.

(Color online) Setup of the second harmonic near-field optical microscope (SH-SNOM) based on silicon AFM tips. The inset shows a SEM image of the test sample with an array of lithographically prepared gold cylinders with a diameter of and height of . The particle-to-particle distance is about .

Image of FIG. 2.
FIG. 2.

One-dimensional scan in the direction across a sharp edge of thick gold stripe on an ITO-glass substrate. Measured FH and SH signals are shown together with the determined resolution based on 20%–80% criteria.

Image of FIG. 3.
FIG. 3.

(Color online) Topography (a), first harmonic (FH) (b), and second harmonic (SH) near-field (c) images of gold nanoparticles on ITO glass prepared by e-beam lithography.

Image of FIG. 4.
FIG. 4.

(Color online) area with gold nanoparticles of the same test sample. The resulting FH (a) and SH (b) images are shown together with cross sections through the largest contrast areas.

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/content/aip/journal/apl/90/9/10.1063/1.2709941
2007-02-28
2014-04-16
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Near-field second harmonic generation by using uncoated silicon tips
http://aip.metastore.ingenta.com/content/aip/journal/apl/90/9/10.1063/1.2709941
10.1063/1.2709941
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