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Quality factors of nonideal micro pillars
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10.1063/1.2751586
/content/aip/journal/apl/91/1/10.1063/1.2751586
http://aip.metastore.ingenta.com/content/aip/journal/apl/91/1/10.1063/1.2751586
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

(Color online) [(a) and (b)] Illustrations of the two pillar geometry imperfections considered and (c) the staircase approximation used for the type I imperfection.

Image of FIG. 2.
FIG. 2.

factor for (a) type I and (b) type II imperfections and (c) under influence of material loss.

Image of FIG. 3.
FIG. 3.

factor for the optimized structure, in (a) for type I imperfection, in (b) for type II imperfection, and in (c) for type II imperfection with an artificial GaAs etch.

Image of FIG. 4.
FIG. 4.

(Color online) Radial electric field profiles in top DBR mirror for inclination angles of (a) 0° and (b) 0.9°.

Image of FIG. 5.
FIG. 5.

(Color online) (a) Reflectivity and (b) overlap of modes in GaAs and AlAs layers as a function of etch depth.

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/content/aip/journal/apl/91/1/10.1063/1.2751586
2007-07-06
2014-04-18
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Quality factors of nonideal micro pillars
http://aip.metastore.ingenta.com/content/aip/journal/apl/91/1/10.1063/1.2751586
10.1063/1.2751586
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