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(a) Absorption and time-integrated PL spectra of MEH-PPV before (empty circles and squares, respectively) and after (superimposed lines) EBL. The vertical arrows indicate the observed blueshift of the spectra after exposure. (b) PL intensity (squares, left vertical scale) and peak wavelength (circles, right vertical scale) vs EBL dose. Inset: ASE spectra from native (full line) and irradiated (dotted line) MEH-PPV films.
Ellipsometry data: and as measured (dashed lines) or generated by the fitting (dotted lines) at different angles of incidence from 35° to 75° on pristine MEH-PPV film on a substrate, and in-plane and out-of-plane refractive indices of the film as deduced by fitting.
(Color online) Surface morphology of MEH-PPV patterned by EBL at (a) 120, (b) 180, (c) 210, and (d) , investigated by AFM. Grating period of . Vertical scale of and scan size of . Inset of (d): AFM cross section of the profile ( vs ) of the exposed stripes along the continuous line shown in (d).
DFB emission spectra below and above threshold (, solid curve and , full squares) with , and DFB spectrum above threshold with (full circles). Inset: DFB peak emission intensity vs absorbed excitation fluence for (squares) and (circles). The solid lines are linear fits to the experimental data.
Peak wavelengths and FWHM of emission (, ) and absorption (, ), PL quantum yield , and refractive indexes ( and ) in the plane of the film surface and along the surface normal, respectively, for MEH-PPV before and after EBL.
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