1887
banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
High resolution transmission electron microscopy of InN
Rent:
Rent this article for
USD
10.1063/1.2779843
/content/aip/journal/apl/91/10/10.1063/1.2779843
http://aip.metastore.ingenta.com/content/aip/journal/apl/91/10/10.1063/1.2779843
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

HRTEM images of (a) sample A showing inclusions of in size. The inset shows a magnified image of an inclusion. (b) Sample B showing inclusions of about in size. Moiré pattern visible on the lower left side of the cluster is compatible with tetragonal metallic indium.

Image of FIG. 2.
FIG. 2.

High resolution lattice image of an inclusion in sample A. The power spectra of selected areas as indicated show no additional spots, but a widening caused by strain in the inclusion is observed.

Image of FIG. 3.
FIG. 3.

Simulated InN lattice image with a thickness of containing an indium inclusion of in the center. The Fourier transforms do not show additional diffraction spots due to the inclusion.

Image of FIG. 4.
FIG. 4.

PL spectra measured in the samples A and B with In clusters sizes of and , respectively. Excitation is done by a line of a InGaAs laser, detection by a combination of InGaAs Hamamatsu and PbS detectors.

Loading

Article metrics loading...

/content/aip/journal/apl/91/10/10.1063/1.2779843
2007-09-06
2014-04-23
Loading

Full text loading...

This is a required field
Please enter a valid email address
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: High resolution transmission electron microscopy of InN
http://aip.metastore.ingenta.com/content/aip/journal/apl/91/10/10.1063/1.2779843
10.1063/1.2779843
SEARCH_EXPAND_ITEM