1887
banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
Hydrogen bonding at grain surfaces and boundaries of nanodiamond films detected by high resolution electron energy loss spectroscopy
Rent:
Rent this article for
USD
10.1063/1.2779848
/content/aip/journal/apl/91/10/10.1063/1.2779848
http://aip.metastore.ingenta.com/content/aip/journal/apl/91/10/10.1063/1.2779848
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

(a) HR-EEL spectra of as-deposited HF CVD films as a function of annealing temperature. The primary electron energy was and FWHM of . The shape of the spectrum is nearly unchanged up to . The results in complete hydrogen desorption (the absence of peak) alongside with appearance of dimer mode at . (b) Detailed analysis of HR-EELS C–H stretching mode of as-deposited HF CVD diamond film. Peak fitting procedure reveals three different contributions at , , and energy loss.

Image of FIG. 2.
FIG. 2.

HR-EEL spectra of MW CVD deposited nanodiamond films with grain size. (a) As-deposited sample in situ annealed to . (b) As-deposited sample followed subsequent in situ annealing to . (c) As-deposited sample followed ex situ MW hydrogenation for and consequent in situ annealing to . [(d)–(f)] Detailed analysis of HR-EELS C–H stretching mode [data originated from spectra (a)–(c) correspondingly]. Note the splitting of C–H stretching mode of as-deposited nanodiamond sample due to strong contribution of mode. The last mode disappears following ex situ MW-H treatment [spectra (c) and (f)].

Loading

Article metrics loading...

/content/aip/journal/apl/91/10/10.1063/1.2779848
2007-09-04
2014-04-23
Loading

Full text loading...

This is a required field
Please enter a valid email address
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Hydrogen bonding at grain surfaces and boundaries of nanodiamond films detected by high resolution electron energy loss spectroscopy
http://aip.metastore.ingenta.com/content/aip/journal/apl/91/10/10.1063/1.2779848
10.1063/1.2779848
SEARCH_EXPAND_ITEM