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(Color online) Structural characterization of InAsSb layer. (a) AFM surface with rms roughness of and (b) high resolution x-ray diffraction revealing lattice mismatch of different InAsSb structures to GaSb substrate.
(Color online) vs GaSb capping layer thickness. Inset: a scanning electron microscopy image of device’s mesa with overhang GaSb area at the sidewall.
(Color online) Quantum efficiency of structures with different GaSb capping layer’s thicknesses. Red dotted line is spectra of -on- reference structure. A superlattice thickness of the structures is .
(Color online) Fabry-Perot slope vs device thickness. Inset: linear relation between peak/valley positions and interference order of studied samples.
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