Full text loading...
(a) UV Raman spectra at of the STO thin films grown by MBE on Si substrate at different of 700, 800, 900, and . Peaks with ▿ are related to the second-order processes, and those with ▾ to Si substrate. (b) Temperature evolution of phonon of the STO thin films under . All spectra are plotted on the same scale, offset for clarity.
Temperature dependence of normalized Raman intensities of phonons (solid squares) for the four STO thin films with different . The solid curves are fits to the linear temperature dependence.
Dependence of on the thermal expansion coefficient mismatch and thermal strain determined from the hard mode Raman intensities of different . The dotted curve displays a linear fit to the thermal strain dependence, the dashed one demonstrates the predicted behavior of (Ref. 30).
Raman frequency of the hard mode in STO thin films with different as a function of temperature. The dash-dotted lines show points where this mode vanishes.
Article metrics loading...