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(a) SEM image of -wide, -thick, -long Au–Pd nanowire. (b) Calculated distribution of temperature (due to Joule heating) and stress due to electromigration and Joule heating in a nanowire. The point corresponds to the center of the wire.
(a) Comparison of measured (points) and calculated (curves) dependences of current and resistance vs applied voltage, showing excellent agreement. (b) Current-voltage characteristics of four Au and four Au–Pd wires to the point of failure, taken at a voltage ramp rate of .
Postfailure SEM images of wires illustrating different failure regimes, (a) failure due to heating, (b) electromigration, and (c) a combination of both. Regime (c) leads to the most reliable and reproducible nanogaps.
Postfailure tunneling curves for two different devices.
Bin graph illustrating degree of reproducibility of gap formation.
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