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Characterization of Si nanostructures using a noncontact mode scanning near-field optical Raman microscope, with spatial resolution and depth resolution, using ultraviolet resonant Raman scattering
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10.1063/1.2780114
/content/aip/journal/apl/91/13/10.1063/1.2780114
http://aip.metastore.ingenta.com/content/aip/journal/apl/91/13/10.1063/1.2780114
/content/aip/journal/apl/91/13/10.1063/1.2780114
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/content/aip/journal/apl/91/13/10.1063/1.2780114
2007-09-28
2014-07-23
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Characterization of Si nanostructures using a noncontact mode scanning near-field optical Raman microscope, with 100nm spatial resolution and 5nm depth resolution, using ultraviolet resonant Raman scattering
http://aip.metastore.ingenta.com/content/aip/journal/apl/91/13/10.1063/1.2780114
10.1063/1.2780114
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