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Magnetization and resistance as a function of temperature for (a) sputtered sample and MAD films of nominal composition (b) and (c) . The saturation magnetization was determined from hysteresis measurements (not shown here).
XRD pattern and calculated lattice constants of a LCeMO film sputtered on LAO. One can identify a pseudocubic phase with a perovskitelike lattice parameter and an additional fcc phase.
Sputtered LCeMO film as seen in a cross section in the TEM. (a) Bright field, from bottom to top: substrate (LAO), film (thickness is ), protective platinum layer deposited during FIB specimen preparation. (b) Dark field. (c) Sputtered LCeMO film as seen from above in a high resolution TEM plan view. (d) Dark field.
Composition of the sputtered LCeMO film determined by EDX in the TEM. The measurement line starts in the matrix (M) and then runs through two columns (C).
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