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Edge effects in buckled thin films on elastomeric substrates
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10.1063/1.2791004
/content/aip/journal/apl/91/13/10.1063/1.2791004
http://aip.metastore.ingenta.com/content/aip/journal/apl/91/13/10.1063/1.2791004
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

(Color online) Schematic illustration of the process for fabricating buckled single crystal Si ribbons (green) on a PDMS (blue) substrate.

Image of FIG. 2.
FIG. 2.

(Color online) (a) Images and (b) linecuts of atomic force micrographs and (c) finite element results of buckled single crystal Si ribbons on PDMS substrate. The images in the left and right columns are for the center part and edge of the Si thin film, respectively.

Image of FIG. 3.
FIG. 3.

(Color online) Wavelength and amplitude around the center part of buckled Si thin film vs the prestrain.

Image of FIG. 4.
FIG. 4.

The edge-effect length vs prestrain for Young’s modulus of of the PDMS substrate (top panel); its inset gives the definition of ; the edge-effect length is shown in the bottom left panel for Young’s moduli of 2 and of the PDMS substrate; the distribution of axial force in the Si thin film is shown in the bottom right panel.

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/content/aip/journal/apl/91/13/10.1063/1.2791004
2007-09-27
2014-04-23
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Edge effects in buckled thin films on elastomeric substrates
http://aip.metastore.ingenta.com/content/aip/journal/apl/91/13/10.1063/1.2791004
10.1063/1.2791004
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