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(Color online) Schematic illustration of the process for fabricating buckled single crystal Si ribbons (green) on a PDMS (blue) substrate.
(Color online) (a) Images and (b) linecuts of atomic force micrographs and (c) finite element results of buckled single crystal Si ribbons on PDMS substrate. The images in the left and right columns are for the center part and edge of the Si thin film, respectively.
(Color online) Wavelength and amplitude around the center part of buckled Si thin film vs the prestrain.
The edge-effect length vs prestrain for Young’s modulus of of the PDMS substrate (top panel); its inset gives the definition of ; the edge-effect length is shown in the bottom left panel for Young’s moduli of 2 and of the PDMS substrate; the distribution of axial force in the Si thin film is shown in the bottom right panel.
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