1887
banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
Epitaxial growth of AlN films on Rh ultraviolet mirrors
Rent:
Rent this article for
USD
10.1063/1.2793187
/content/aip/journal/apl/91/13/10.1063/1.2793187
http://aip.metastore.ingenta.com/content/aip/journal/apl/91/13/10.1063/1.2793187
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

XPS spectra of (a) O and (b) C for Rh(111) during annealing at various temperatures.

Image of FIG. 2.
FIG. 2.

RHEED patterns from AlN films grown at (a) and (b) . The incidence of the electron beam is parallel to .

Image of FIG. 3.
FIG. 3.

Growth temperature dependence of (a) the interfacial layer thickness between AlN films and Rh substrates, evaluated using GIXR and (b) XPS spectra of Rh from the surface of .

Image of FIG. 4.
FIG. 4.

An EBSD pole figure for the sample grown at .

Loading

Article metrics loading...

/content/aip/journal/apl/91/13/10.1063/1.2793187
2007-09-28
2014-04-24
Loading

Full text loading...

This is a required field
Please enter a valid email address
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Epitaxial growth of AlN films on Rh ultraviolet mirrors
http://aip.metastore.ingenta.com/content/aip/journal/apl/91/13/10.1063/1.2793187
10.1063/1.2793187
SEARCH_EXPAND_ITEM