Full text loading...
(Color online) AFM images for (a) the original Si NCs and (b) the HNCs. The same scale is used for both images. The sharper feature in HNC image suggests that HNCs are higher due to extra growth of Ge on Si.
XPS elemental analysis for Si NCs (bottom curve) and HNCs (top curve).
HNC memory transfer characteristics under fresh, written, and erased conditions.
Writing and erasing performance comparison between the Si NC memory devices and the HNC memory devices.
Endurance characteristics of Si NC memory devices and HNC memory devices.
Retention characteristics of Si NC memory devices and HNC memory devices.
Article metrics loading...