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Data retention characteristics of thin films on conductive electrodes
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10.1063/1.2780118
/content/aip/journal/apl/91/14/10.1063/1.2780118
http://aip.metastore.ingenta.com/content/aip/journal/apl/91/14/10.1063/1.2780118

Figures

Image of FIG. 1.
FIG. 1.

X-ray diffraction scans of BLT thin films deposited on (a) Pt and (b) SRO-coated substrates. denotes substrate peak.

Image of FIG. 2.
FIG. 2.

Test pulse sequences for the measurement of (a) same-state and (b) opposite-state retention.

Image of FIG. 3.
FIG. 3.

Time-dependent variations of (a) switched and nonswitched polarization values; (b) memory windows for same-state and opposite-state retention. Pt/BLT/Pt capacitors were used for the measurement. Inset shows the hysteresis curves before and after retention test. Measured data were fitted using a stretched exponential decay model shown as solid lines in (b).

Image of FIG. 4.
FIG. 4.

Time-dependent variations of (a) switched and nonswitched polarization values; (b) memory windows for same-state and opposite-state retention. Pt/BLT/SRO capacitors were used for the measurement. Inset shows the hysteresis curves before and after retention test. Measured data were fitted using a stretched exponential decay model shown as solid lines in (b).

Tables

Generic image for table
Table I.

Parameters obtained by the fitting of experimental data with a stretched exponential decay function.

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/content/aip/journal/apl/91/14/10.1063/1.2780118
2007-10-01
2014-04-16
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Data retention characteristics of Bi3.25La0.75Ti3O12 thin films on conductive SrRuO3 electrodes
http://aip.metastore.ingenta.com/content/aip/journal/apl/91/14/10.1063/1.2780118
10.1063/1.2780118
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