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Medium resolution off-axis electron holography with millivolt sensitivity
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10.1063/1.2794006
/content/aip/journal/apl/91/14/10.1063/1.2794006
http://aip.metastore.ingenta.com/content/aip/journal/apl/91/14/10.1063/1.2794006

Figures

Image of FIG. 1.
FIG. 1.

SIMS profile (solid line) and associated simulated potential (dashed line) showing the 30- and -spaced highly doped layers.

Image of FIG. 2.
FIG. 2.

(a) Reconstructed phase images for each hologram acquired. (b) Profiles extracted from the phase images acquired using a biprism voltage of and averaged over . The profiles correspond to 128, 64, 16, and acquisitions from top to bottom. (c) Same (b), except using a biprism voltage of . (d) Magnified profile of the -spaced layers associated with the acquisition from (c).

Tables

Generic image for table
Table I.

Hologram contrast, counts per CCD pixel, theoretical phase resolution, and random noise determined from the scatter on a single, nonaveraged profile extracted from a reconstructed hologram containing only vacuum.

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/content/aip/journal/apl/91/14/10.1063/1.2794006
2007-10-01
2014-04-18
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Medium resolution off-axis electron holography with millivolt sensitivity
http://aip.metastore.ingenta.com/content/aip/journal/apl/91/14/10.1063/1.2794006
10.1063/1.2794006
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