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(a) Ni and Ni spectra of the as-grown and (b) the one annealed in oxygen.
Current-voltage characteristic of heterostructure characterized vertically.
XRD spectrum of the heterostructure.
TEM image of the cross-sectional heterostructure. The inset presents the interfaces between Ni–Ti layer and its adjacent layers (i.e., LSCO and Si).
(a) A typical hysteresis loop of the LSCO/PZT/LSCO capacitors integrated on . The inset shows the switchable polarization as a function of applied voltage. (b) Fatigue characteristic of the LSCO/PZT/LSCO capacitor as a function of switching cycles.
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