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Setup for the EFM measurements on current-carrying H-terminated diamond film surfaces, which includes harmonic detection of the phase shift variations of the AFM cantilever oscillations at the frequency that is used to modulate the current flowing across the diamond film sample between the two electrodes.
EFM images of the current-carrying H-terminated diamond film surface for a highly conductive (a) and a poorly conductive (c) samples. The bright feature in the upper right corner of image (a) is an artifact caused by the presence of a dust particle. Voltage profiles along the dashed lines indicated in (a) and (c) are shown in (b) and (d), respectively.
topographic AFM image of the poorly conductive sample (a). Corresponding EFM images of the film surface without any current flow (b), and of the current-carrying film surface (c). Voltage profiles along the three lines (A, B, and C) indicated in (c) are shown in (d).
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