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(a) XRD patterns of three distinct layered structures in descending order: a PZT/NZFO bilayer , a PZT/NZFO/PZT trilayer , and a PZT/NZFO multilayer structure consisting of 11 alternating layers . (b) XRD -scan spectra of the -thick PZT/NZFO bilayer.
(a) hysteresis loops obtained at and (b) hysteresis curve of the PZT/NZFO multilayer structure consisting of 11 alternating layers.
ME coupling characteristics of the -thick PZT/NZFO multilayer consisting of 11 alternating layers. (a) Percent change in the real part of dielectric permittivity at various measuring ac electric-field frequencies. (b) Longitudinal ME susceptibility plotted as a function of .
Longitudinal ME voltage susceptibility values obtained by “dynamic” ME measurements at and with the amplitude of an oscillating magnetic field of . Both the bias field and the oscillating field are parallel to the direction 3.
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