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The CR-TOF experiment: (a) device structure, (b) charge injection from the injecting contact into the sample layer, (c) charge accumulation at the sample/blocking layer interface, and (d) charge retraction from the interface, producing the TOF current transient.
Determination of transition voltage for -MTDATA . Curve: linear sweep voltammogram. Symbols: excess charge from charging (for ) at various voltages and retracting at .
Driving waveforms for (a) transient SCLC and (b) CR-TOF measurements. (c) Transient SCLC of -MTDATA at bias ( internal field). (d) CR-TOF transient of -MTDATA at ( across total, ) after charging at .
(Color online) (a) Hole mobility in -MTDATA measured by transient SCLC and CR-TOF (267, 535, and layers). The lines are the Poole-Frenkel fits from the literature (Refs. 12 and 13). (b) Hole mobility in NPB ( layer) measured by CR-TOF, with literature trend lines (Refs. 14–16). [Inset in (b)] CR-TOF transient of NPB at ( across total, ) after charging at .
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