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(Color online) High-resolution x-ray diffraction pattern of thin films studied in this experiment, where (a) , (b) , (c) , (d) , (e) , and (f) . The inset shows the XRD data plotted on a logarithmic scale. As evident, no additional phases are seen.
(Color online) Hysteresis loop ( curve) of thin films measured at RT, where the inset provides the AGFM data obtained with the diamagnetic contribution from the Si substrate for .
(Color online) NEXAFS spectra at O edges of thin films. Evolution of preedge peak is marked by an arrow.
(Color online) NEXAFS spectra at Mn edge of thin films for various concentrations are shown. Inset: MnO and reference compounds for comparison.
(Color online) Mn NEXAFS and XMCD of Zn–Mn–O at RT, obtained with the photon helicity parallel and antiparallel to the magnetization. Inset: plot of the XMCD signal of Mn doped ZnO.
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