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(Color online) (a) Schematic layer structure of the laser device. (b) Scanning electron microscope image of the photonic feedback structure without MeLPPP coating. The part imaged is marked in the device top view.
(Color online) Comparison of the measured and the calculated band structures. The emission spectrum is measured for a range of tilting angles. Each spectrum is divided by a spectrum obtained from an adjacent unstructured area near the device on the same substrate. Hence, a value corresponds to an increase and a value to a decrease compared with the emission from the neat MeLPPP film.
(Color online) Emission spectrum below and above the lasing threshold. The laser device consists of a second-order photonic feedback structure. For comparison, also a spectrum from a device area without feedback structure is shown.
(Color online) Comparison of the feedback structures with and without encompassing first-order “mirror.” The change in the slope of the measured emission intensities as a function of the pump power is a signature of the lasing threshold.
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