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Film thickness dependence of the measured in-plane (circles) and out-of-plane (squares) lattice parameters of epitaxial LSCO films grown on (a) (001) LAO and (b) (001) STO substrates. The bulk parameters of the LSCO target are indicated by the horizontal dashed line. The size of the error bars is smaller than that of the symbols.
Film thickness dependence of for epitaxial LSCO thin films grown on LAO and STO. The dashed line is our calculation for based on finite size scaling alone as described in the text.
Phase diagram of ferromagnetic transition temperature as a function of in-plane strain for films with thickness of . The interpolation to zero strain indicates a of about , indicated as the horizontal dashed line.
Exchange interaction vs in-plane strain. The inset shows the reduced magnetization as a function of with an applied magnetic field of for the same films, as in Fig. 3. We fit the data according to Bloch’s law to derive the spin wave parameter and thus .
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