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(Color online) Measured TE- and TM-PPL spectra for different annealing durations for samples with -, -, and cap layers experienced ICP exposure and RTA at .
(Color online) Measured C-HH and C-LH blueshifts (a) and calculated diffusion lengths of group V and group III sublattices (b) vs annealing duration.
(Color online) Measured XPS spectra of an as-grown InP sample and a sample after argon-ICP exposure for . The inset shows that the binding energy of shifted after ICP exposure.
Schematic band diagrams for (a) , (b) , and (c) showing enhancement [(a) and (b)] or suppression (c) of the diffusion of positively charged point defects from surface to bulk under the electric field within the space charge region.
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