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Estimation of parametric gain in waveguides by fluorescence and second harmonic generation measurements
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10.1063/1.2806933
/content/aip/journal/apl/91/19/10.1063/1.2806933
http://aip.metastore.ingenta.com/content/aip/journal/apl/91/19/10.1063/1.2806933
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

SEM picture of the multilayer waveguide. The nonconventional transverse profile, which is a signature of the anisotropy of chemical etching, is longitudinally invariant and therefore affects by no means the optical losses.

Image of FIG. 2.
FIG. 2.

PF spectra at degeneracy (solid line) and off degeneracy (dotted line). Inset: tuning curve (experimental points and fitting curve). Because of detector cutoff, data points beyond are inferred from frequency conservation.

Image of FIG. 3.
FIG. 3.

PF power vs pump power at degeneracy.

Image of FIG. 4.
FIG. 4.

SHG phase-matching curve vs waveguide temperature, for a FF wavelength of . Inset: experimental setup scheme, where output FF (SH) is measured with an InGaAs (Si) calibrated photodiode and lock-in amplification.

Image of FIG. 5.
FIG. 5.

SH vs FF power: experimental data (circles) and quadratic fit (solid line).

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/content/aip/journal/apl/91/19/10.1063/1.2806933
2007-11-07
2014-04-20
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Estimation of parametric gain in GaAs∕AlOx waveguides by fluorescence and second harmonic generation measurements
http://aip.metastore.ingenta.com/content/aip/journal/apl/91/19/10.1063/1.2806933
10.1063/1.2806933
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