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Orientation dependence of dielectric and ferroelectric properties of multilayered thin films
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10.1063/1.2807839
/content/aip/journal/apl/91/19/10.1063/1.2807839
http://aip.metastore.ingenta.com/content/aip/journal/apl/91/19/10.1063/1.2807839
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

(Color online) XRD patterns of the PZT multilayered thin films deposited on the (a) , (b) , and (c) substrates.

Image of FIG. 2.
FIG. 2.

(Color online) Relative dielectric constant and dielectric loss of the PZT multilayered thin films as a function of frequency.

Image of FIG. 3.
FIG. 3.

(Color online) loops of the PZT multilayered thin films with different orientations.

Image of FIG. 4.
FIG. 4.

(Color online) Remnant polarization and coercive field of the PZT multilayered thin films as a function of applied field.

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/content/aip/journal/apl/91/19/10.1063/1.2807839
2007-11-05
2014-04-18
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Orientation dependence of dielectric and ferroelectric properties of Pb(Zr0.8Ti0.2)O3∕Pb(Zr0.2Ti0.8)O3 multilayered thin films
http://aip.metastore.ingenta.com/content/aip/journal/apl/91/19/10.1063/1.2807839
10.1063/1.2807839
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