1887
banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
thin films on different substrates for ferroelectric memory applications
Rent:
Rent this article for
USD
10.1063/1.2811957
/content/aip/journal/apl/91/19/10.1063/1.2811957
http://aip.metastore.ingenta.com/content/aip/journal/apl/91/19/10.1063/1.2811957
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

X-ray diffraction patterns of on (a) , (b) , and (c) Si substrates annealed at for .

Image of FIG. 2.
FIG. 2.

characteristics of (a) , (b) , and capacitors.

Image of FIG. 3.
FIG. 3.

Typical hysteresis loop for capacitor.

Image of FIG. 4.
FIG. 4.

characteristics of (a) , (b) , and capacitors.

Image of FIG. 5.
FIG. 5.

Temperature dependence of capacitance at for deposited on substrate.

Loading

Article metrics loading...

/content/aip/journal/apl/91/19/10.1063/1.2811957
2007-11-09
2014-04-25
Loading

Full text loading...

This is a required field
Please enter a valid email address
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: (Na0.5Bi0.5)0.87Pb0.13TiO3 thin films on different substrates for ferroelectric memory applications
http://aip.metastore.ingenta.com/content/aip/journal/apl/91/19/10.1063/1.2811957
10.1063/1.2811957
SEARCH_EXPAND_ITEM