1887
banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
Dispersion of silicon nonlinearities in the near infrared region
Rent:
Rent this article for
USD
10.1063/1.2750523
/content/aip/journal/apl/91/2/10.1063/1.2750523
http://aip.metastore.ingenta.com/content/aip/journal/apl/91/2/10.1063/1.2750523
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Experimental setup used for z-scan measurements. OPA: optical parametric amplifier. ATT: attenuator. Det: detector.

Image of FIG. 2.
FIG. 2.

Z-scan traces at (a) and (b) with open and closed apertures, with pulse energies of and (corresponding peak intensities of and ), respectively. In each case, solid dots show the experimental data and solid curves show a theoretical fit.

Image of FIG. 3.
FIG. 3.

Measured wavelength dependence of (a) TPA coefficient and (b) Kerr coefficient . Error bars are plotted as of the experimental data.

Image of FIG. 4.
FIG. 4.

(Color online) Nonlinear figure of merit of silicon as a function of wavelength based on the measurements.

Loading

Article metrics loading...

/content/aip/journal/apl/91/2/10.1063/1.2750523
2007-07-12
2014-04-18
Loading

Full text loading...

This is a required field
Please enter a valid email address
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Dispersion of silicon nonlinearities in the near infrared region
http://aip.metastore.ingenta.com/content/aip/journal/apl/91/2/10.1063/1.2750523
10.1063/1.2750523
SEARCH_EXPAND_ITEM