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Experimental setup used for z-scan measurements. OPA: optical parametric amplifier. ATT: attenuator. Det: detector.
Z-scan traces at (a) and (b) with open and closed apertures, with pulse energies of and (corresponding peak intensities of and ), respectively. In each case, solid dots show the experimental data and solid curves show a theoretical fit.
Measured wavelength dependence of (a) TPA coefficient and (b) Kerr coefficient . Error bars are plotted as of the experimental data.
(Color online) Nonlinear figure of merit of silicon as a function of wavelength based on the measurements.
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