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Integrated PL intensities from Er-doped SRSO films. An is the film annealed only, IrAn is the film annealed after irradiation, and AnIrAn are the films annealed before and after irradiation. The inset shows PL decay traces of the films with Si concentration.
Pump-power dependence of the nc-Si mediated excitation rate , obtained by measuring the difference in the PL rise and decay time as the pump beam is turned on and off.
Intrinsic nc-Si PL spectra from Er-doped SRSO films, measured at the same time as the PL spectra. The inset shows the normalized PL spectra, demonstrating that the position and shape of the nc-Si PL spectra are not affected significantly by ion irradiation.
PL spectra for An and IrAn Er-doped films. The inset shows annealing temperature dependence of PL decay lifetimes for both films.
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