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(a) TEM image of as-prepared products composed of randomly oriented nanowires. (b) XRD pattern of nanowires. (c) TEM image of a typical nanowire. (d) SAED pattern of individual nanowire. (e) High-resolution TEM image of the nanowire.
SEM micrographs of crossed sections of ceramics derived from single-crystalline nanowires. The inset shows room temperature Raman spectra. The open circles are plotted for every fifth point of the experimental data and the solid lines display the spectral deconvolution.
Temperature dependence of dielectric constant and loss at various frequencies for ceramics derived from single-crystalline nanowires.
ln as a function of ln at and the inset shows a Vogel-Fulcher fit, where the solid line represents the linear fit.
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