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Grating induced micelle alignment of mesostructured silica films
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10.1063/1.2755722
/content/aip/journal/apl/91/2/10.1063/1.2755722
http://aip.metastore.ingenta.com/content/aip/journal/apl/91/2/10.1063/1.2755722
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Typical AFM images of a grating. The left image is a top-down view. The scale bar is . The right image is the three-dimensional (3D) view of one part of left image showing a measured depth of .

Image of FIG. 2.
FIG. 2.

Stylized representation of the film structure. Films are considered to be made of layer 1 composed of surfactant and silica of thickness with an electron density , and of silica layer 2 of thickness with an electron density . The in-plane spacing between micelles or pores is denoted as . For clarity, the figure shows only three layers out of the nine bilayers present in a film. Films are supported by a silicon substrate and a silica cap, and buffer layers are also introduced in the model.

Image of FIG. 3.
FIG. 3.

Absolute reflectivity curve of the as-prepared film. The top inset gives the GISAXS pattern of the as-prepared mesostructured film. The dipping velocity of this film is . The film thickness is about .

Image of FIG. 4.
FIG. 4.

(Color online) AFM images of a 2D hexagonal mesostructured silica film deposited on silicon wafer (a) before and (b) after etching in NaOH. The insets [both (a) and (b)] present 3D images of the central regions and provide -scale information.

Image of FIG. 5.
FIG. 5.

(Color online) AFM images of the etched 2D hexagonal mesostructured films that were deposited on the gratings using two conditions, (a) where the film thickness, , was higher than the height of lines of grating, and (b) where the film thickness was lower, , than the height of lines of grating. The bottom right inset presents the GISAXS pattern of the orientated mesostructured film confirming the 2D hexagonal structure. The top insets [both (a) and (b)] present 3D images of the central regions and provide -scale information.

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/content/aip/journal/apl/91/2/10.1063/1.2755722
2007-07-09
2014-04-18
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Grating induced micelle alignment of mesostructured silica films
http://aip.metastore.ingenta.com/content/aip/journal/apl/91/2/10.1063/1.2755722
10.1063/1.2755722
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