1887
banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
Fine structure in the tunneling characteristic of thin films
Rent:
Rent this article for
USD
10.1063/1.2755921
/content/aip/journal/apl/91/2/10.1063/1.2755921
http://aip.metastore.ingenta.com/content/aip/journal/apl/91/2/10.1063/1.2755921
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Inductively measured transition temperature (50% midpoint) vs the substrate temperature . The vertical bars indicate the 90%–10% transition width, . The inset shows an exemplary transition curve.

Image of FIG. 2.
FIG. 2.

Temperature-dependent resistivity of films deposited on -plane sapphire at substrate temperatures of 430 and .

Image of FIG. 3.
FIG. 3.

Negative second derivative measurements, vs , on /insulator/In tunnel junctions at and . Upper trace: film with , lower trace: film with .

Loading

Article metrics loading...

/content/aip/journal/apl/91/2/10.1063/1.2755921
2007-07-13
2014-04-20
Loading

Full text loading...

This is a required field
Please enter a valid email address
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Fine structure in the tunneling characteristic of MgB2 thin films
http://aip.metastore.ingenta.com/content/aip/journal/apl/91/2/10.1063/1.2755921
10.1063/1.2755921
SEARCH_EXPAND_ITEM