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Effect of electron-phonon coupling on the characteristics in the structure at zero temperature and for various coupling constants: (solid line), (dot-dashed line), and (dashed line). The Fermi level in the emitter contact: .
The Fano factor is plotted vs the bias for the same devices as those in Fig. 1. Note that on the noise behavior in different bias regions: Poissonian at low and very high bias; sub-Poissonian in the region close to the resonance; and super-Poissonian in the PAT region.
The Fano factor is plotted vs the bias for devices with different emitter Fermi energies: (solid line), (dot dashed-line), and (dashed line). The PAT peak is suppressed as increases.
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