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Interaction of a spherical AFM probe with two-layer cell structure. is the relative scanner position of cantilever, is the cantilever deflection, is the nondeformed position of the inner layer of sample, is the deformation of sample, is for the maximum deflection (assigned by the AFM user), and is the separation between the cell body and the AFM probe.
(a) Forces of interaction between the AFM probe and the brush layer obtained by processing raw force data. (b) Fitting Eq. (1) for an example of two representative force curves of (a). The best fits are also shown for these curves if they were due to the elastic response on the medium of the first layer described by the Hertzian model.
Distribution of the brush parameters obtained for human cervical epithelial cells.
(a) Representative confocal image of a cell showing the brush. To distinguish the cell surface brush and filopodia developed on the Petri dish surface, the images were taken at the middle of cell height. (b) We also show three dimensional cross sections of cells. The arrows indicate vertical direction pointing out of the Petri dish. Scale bars are .
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