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Characterization of biaxial stress and its effect on optical properties of ZnO thin films
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10.1063/1.2757149
/content/aip/journal/apl/91/2/10.1063/1.2757149
http://aip.metastore.ingenta.com/content/aip/journal/apl/91/2/10.1063/1.2757149

Figures

Image of FIG. 1.
FIG. 1.

(a) XRD patterns of (213) diffraction peak for the as-grown ZnO film measured at different inclination angles and (b) a plot of diffraction angles of the (213) peak as a function of .

Image of FIG. 2.
FIG. 2.

FESEM photomicrograph of (a) the as-grown ZnO film and the film annealed at (b) 400, (c) 600, and (d) , respectively.

Image of FIG. 3.
FIG. 3.

Absorption spectra of (S1) as-grown ZnO film and the film annealed at (S2) 400, (S3) 600, and (S4) , respectively. The inset shows the band gap of the ZnO films as a function of the biaxial stress.

Tables

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Table I.

Diffraction angles of (002) peak, measured biaxial stress, as well as calculated thermal and lattice mismatch stresses of as-grown and annealed ZnO films.

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/content/aip/journal/apl/91/2/10.1063/1.2757149
2007-07-13
2014-04-20
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Characterization of biaxial stress and its effect on optical properties of ZnO thin films
http://aip.metastore.ingenta.com/content/aip/journal/apl/91/2/10.1063/1.2757149
10.1063/1.2757149
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