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(a) XRD patterns of (213) diffraction peak for the as-grown ZnO film measured at different inclination angles and (b) a plot of diffraction angles of the (213) peak as a function of .
FESEM photomicrograph of (a) the as-grown ZnO film and the film annealed at (b) 400, (c) 600, and (d) , respectively.
Absorption spectra of (S1) as-grown ZnO film and the film annealed at (S2) 400, (S3) 600, and (S4) , respectively. The inset shows the band gap of the ZnO films as a function of the biaxial stress.
Diffraction angles of (002) peak, measured biaxial stress, as well as calculated thermal and lattice mismatch stresses of as-grown and annealed ZnO films.
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