Full text loading...
Optical micrographs of contact damage in silicon (100), from cyclic loading of spherical indenter at : (a) , (b) , (c) , (d) , and (e) .
Field emission scanning electron microscope images of ring crack segments in silicon (100). (a) Segment immediately outside contact at , showing platelet and particulate ejecta on surface. (b) Segment further outside contact at , showing smearing of ejecta. (c) Computed indenter-specimen displacement as function of distance outside elastic contact, showing how particles become trapped and crushed within gap.
Strength of silicon (100) plates after contact with spherical indenter as a function of number of cycles. Data shown for specimens with cyclic and static indentations. The box at the left is the mean and standard deviations for tests on unindented surface.
Article metrics loading...