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Experimental study of uniaxial stress effects on Coulomb-limited mobility in -type metal-oxide-semiconductor field-effect transistors
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10.1063/1.2807832
/content/aip/journal/apl/91/20/10.1063/1.2807832
http://aip.metastore.ingenta.com/content/aip/journal/apl/91/20/10.1063/1.2807832
/content/aip/journal/apl/91/20/10.1063/1.2807832
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/content/aip/journal/apl/91/20/10.1063/1.2807832
2007-11-13
2014-12-28
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Experimental study of uniaxial stress effects on Coulomb-limited mobility in p-type metal-oxide-semiconductor field-effect transistors
http://aip.metastore.ingenta.com/content/aip/journal/apl/91/20/10.1063/1.2807832
10.1063/1.2807832
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