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(Color online) The Fermi surface of a 6.8 BL Bi(001) film measured by photoemission spectroscopy (Ref. 7). The projected bulk Fermi surface (a tiny hole pocket at and a small electron pocket at ) is also shown by white lines.
(Color online) (a) Measured resistance as a function of the film thickness. The inset shows the close-up by changing the vertical scale. (b) The 2D conductivity obtained by from the data of (a). The solid line shows the parabolic fit for BL. The horizontal error bars show the uncertainty in the film thickness, and the vertical error bars represent the data spread by measuring different parts of the sample. The numbers I–IV in (b) correspond to the different stages of Bi growth on reported in Ref. 6.
(Color online) The schematic drawing of carrier flow inside the film for BL where the scattering is mainly at the interfaces [(a) and (b)], and that for BL where it is due to phonons and defects (c). The measurement configuration with the four probes is also shown in (c) (the length does not scale).
(Color online) RHEED patterns of a clean Bi(001) surface (a), and that after of exposure (b). The triangles in (b) show the spots at the zeroth Laue zone. (c) The conductivity change for the 6 and 30 BL Bi films after exposure.
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