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The diagram of devices and the chemical structures of materials used in this study.
(Color online) The EL enhancement occurs in TNFDM doped device under infrared illumination and the EL emission does not change in undoped device. The right inset shows the EL spectra of TNFDM doped device with and without infrared illumination, and the left inset is the schematic diagram of measurement setup.
EL intensity–bias voltage and current–bias voltage curves under infrared illumination and dark.
The EL increment increases along with intensity of incoming infrared illumination, which were measured in 1, 2, 3, and TNFDM doped device and the bias voltage was fixed at .
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