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Montage of AFM images showing (a) the surface morphology of the Al-sputter-coated Si wafer, (b) the surface of the as deposited BTO-copolymer nanocomposite, and (c) the surface of the composite after annealing at .
X-ray diffraction patterns from the as-deposited and annealed BTO-copolymer nanocomposites.
(a) Frequency dependent capacitance density for the PANI/PU-BT nanocomposites showing as deposited and annealed at (above the Curie temperature). (b) Frequency dependent loss tangent data of the PANI/PU-BT nanocomposites. (c) Frequency dependent capacitance density for the unfilled copolymer. (d) magnitude of impedance for the annealed PANI/PU-BT nanocomposite. The inset shows the circuit model of the capacitor with a testing area of .
Current density-voltage characteristics of the as-deposited and the annealed polymer-BTO composite films.
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